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Cutting-Edge Atomic Spectroscopy: Tutorials, Applications, and Sample Preparation


A Virtual Symposium presented by Spectroscopy


Wednesday, March 25th, 2025

Morning Session: 10am EDT | 7am PDT | 2pm GMT | 3pm CET
Afternoon Session: 1pm EST | 10am PST | 5pm BST | 6pm CET


Event Overview:

Join Spectroscopy, the Society for Applied Spectroscopy (SAS), and the International Atomic Spectroscopy Association (IASA) for a one-day virtual symposium showcasing the latest advancements in atomic spectroscopy—and practical ways to apply them. Day one features hands-on tutorials and presentations covering recent developments in ICP-MS for advanced techniques such laser ablation, speciation analysis, imaging, single-particle analysis, and laser ablation, ICP-MS, and ICP-TOF-MS.

Key Learning Objectives:

Analytical scientists who attend this educational event will learn:

  • Learn from experts about advanced techniques such as single-particle analysis, laser ablation, ICP-MS, and ICP-TOF-MS, along with insights into other emerging technologies shaping the field.
  • Explore innovative applications and sample preparation of these techniques in diverse applications such as high temperature sample introduction, novel sample introduction for difficult samples and microwave based preparation of samples, and the complexities of clinical and forensic sample analysis.
  • Learn actionable “how-to” tips for applying spectroscopy techniques in real-world scenarios from the industry’s top experts, bridging the gap between theoretical knowledge and practical implementation.

Who Should Attend:

Analytical chemists in academia and industry who want to learn more about the latest research, techniques, applications, and trends in atomic spectroscopy analysis.


Full Event Agenda

Session 1 - 10:00am EDT

10:00am EDT Elemental Analysis in Individual Cells: A Challenge for Mass Spectrometry
Maria Montes Bayón, University Professor, University of Oviedo

10:30am EDT Capabilities and Essential Considerations when using single particle ICP-TOFMS to Measure Nanoparticles and Microparticles in Environmental Samples
John W. Olesik, Senior Research Scientist, Adjunct Associsate Professor, and Director of the Trace Element Research Laboratory, The Ohio State University (School of Earth Sciences)

11:00am EDT Direct Analysis of Environmental Samples by Electrothermal Vaporization into ICPOES
Diane Beauchemin, Professor, Associate Head and Chair of Undergraduate Studies, Queen’s University

11:30am EDT Applications of Laser Ablation Time-Of-Flight Mass Spectrometry to Earth Science
John Cottle, Professor of Geology, University of California Santa Barbara

12:00pm EDT Environmental and Geochemical Insights Gained from Improved Single Particle ICP-MS Methods
James Ranville, Professor, Colorado School of Mines, Department of Chemistry

12:30pm EDT Live Q&A

Session 2 - 1:00pm EDT

1:00pm EDT Breaking Barriers in ICP-OES: Generational Advances for Complex Samples and Greener Labs
Erica Cahoon, Portfolio Director, ICP-OES, PerkinElmer

1:20pm EDT Optimizing Trace Metals Analysis for Routine to Challenging Sample Types
Alicia Stell, Market Development Manager, CEM Corporation



Featured Speaker:


Whitepaper

Maria Montes Bayón
University Professor
University of Oviedo

Whitepaper

John W. Olesik
Senior Research Scientist, Adjunct Associsate Professor, and Director of the Trace Element Research Laboratory
The Ohio State University (School of Earth Sciences)

Whitepaper

Diane Beauchemin
Professor, Associate Head and Chair of Undergraduate Studies
Queen’s University



Whitepaper

John Cottle
Professor of Geology
University of California Santa Barbara

Whitepaper

James Ranville
Professor
Colorado School of Mines, Department of Chemistry

Whitepaper

Erica Cahoon
Portfolio Director, ICP-OES
PerkinElmer




Whitepaper

Alicia Stell
Market Development Manager
CEM Corporation





For any technical questions please contact Jorge de la Bandera: jdelabandera@mjhlifesciences.com

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